12th IEEE European Test Symposium
Convention Center, Freiburg, Germany
May 20-24, 2007
Call for Papers
Silicon Debug and Diagnosis
Call for Papers
The IEEE European Test Symposium (ETS) is Europe's premier forum dedicated to presenting and discussing scientific results, emerging ideas, practical applications, hot topics, and new trends in the area of electronic-based circuit and system testing. In 2007, ETS will take place in Freiburg, Southern Germany's Black Forest area. ETS'07 is being organized by the Albert-Ludwigs-University of Freiburg, which celebrates its 550-year anniversary in 2007, and is sponsored by the Test Technology Technical Council (TTTC) of the IEEE Computer Society.
You are invited to participate and submit your contributions to ETS'07. The areas of interest of ETS'07 include (but are not limited to) the following topics:
ETS'07 will produce Formal Proceedings of selected papers, published by the IEEE Computer Society, and an Informal Digest. A post-conference CD-ROM with papers, presentation slides, and photos will be mailed to all participants. The best contributions will be selected for submission to regular issues of the "Journal of Electronic Testing: Theory and Applications" (JETTA), published by Kluwer Academic Publishers. ETS'07 will present a Best Paper Award at ETS'08.
ETS'07 seeks original, unpublished contributions of the following types.
Detailed submission instructions, including selection criteria and publication policies, for the various types of contributions are posted on the ETS'07 web page (here).
TTTC Test Technology Educational Program (TTEP) tutorials on emerging test technology topics will be offered during ETS 2007. Tutorial proposals should be submitted according to TTEP 2007 submission deadlines (http://computer.org/tab/tttc/teg/ttep).
Visit the ETS web page at: http://www.ieee-ets.org
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