13th IEEE European Test Symposium
Verbania, ITALY, May 25-29, 2008

 
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Fringe Workshops
Workshop on Reliability & DfX Engineering for System-in-Package Technologies - SiPeX
Workshop on Low Power Design Impact on Test and Reliability - LPonTR
Conference Location
Verbania
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  Workshop on Low Power Design Impact on Test and Reliability
(LPonTR)
 
The LPonTR workshop aims to bring together design, reliability and test engineers and researchers to discuss the impact of advanced low-power / low voltage design methodologies of nanometer silicon systems on test and reliability. Power and thermal issues, leakage, process variations, enhanced susceptibility to environmental and operation-induced disturbances are physical constraints that drive the need to the development of low-power, process-tolerant design techniques. However, these techniques generate a new set of test and reliability challenges, questing for an innovative set of methodologies and tools.

The LPonTR workshop will be held at the Grand Hotel Majestic, Verbania, Italy
Thursday, 29/05/2008
Technical program Invited Speakers

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