Warehouses at the river.

16th IEEE European Test Symposium
May 23-27, 2011

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Dependability Issues in Deep-submicron Technologies (DDT)

The purpose of the first Workshop on Dependability Issues in Deep-submicron Technologies (DDT) is to bring together experts from the academia and the industry to illustrate all the aspects of dependability issues in deep-submicron technologies, covering from the technological aspects that are essential to understand the fault models for deep-submicron technologies, to architectural aspects needed to design dependable systems based on deep-submicron technologies.

Download the call for papers (pdf).

Download the current program for the workshop (pdf).

Webmaster: Bjørn B. Larsen, Edited: 19.05.2011 - 11:27.