Dependability Issues in Deep-submicron
The purpose of the first Workshop on
Dependability Issues in Deep-submicron Technologies (DDT) is to bring together
experts from the academia and the industry to illustrate all the aspects of
dependability issues in deep-submicron technologies, covering from the
technological aspects that are essential to understand the fault models for
deep-submicron technologies, to architectural aspects needed to design
dependable systems based on deep-submicron technologies.
Download the call for papers (pdf).
Download the current program for the workshop (pdf).