Warehouses at the river.

16th IEEE European Test Symposium
May 23-27, 2011

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Workshop on Low Power Design Impact on Test and Reliability (LPonTR)

The IEEE InternationalWorkshop on Impact of Low Power Design on Test and Reliability (LPonTR) aims to bring together design, reliability and test engineers and researchers to discuss the impact of advanced low-power low-voltage design methodologies of nanometer silicon systems on test and reliability. Power and thermal issues, leakage, process variations, susceptibility to environmental and operation-induced interference drive the development of low-power, process-tolerant design techniques and generate a new set of test and reliability challenges, questing for an innovative set of methodologies and tools.

Download the programme for the workshop. (Published 09.05.2011.)

Download the extended call for papers (pdf). The new deadline is 21st March 2011.

Webmaster: Bjørn B. Larsen, Edited: 27.05.2011 - 09:57.