About the Workshop

The IEEE European Test Workshop is a well-recognized forum for presenting and discussing trends, emerging results, and hot topics in the area of electronic-based circuit and system testing. In 2001, the workshop will take place at Saltsjöbaden, outside Stockholm city center, on one of the most beautiful islands in Sweden.

ETW'01 is the sixth workshop in a series of highly successful events, which were previously organized at:

ETW'01 is sponsored by the IEEE Computer Society - Test Technology Technical Council (TTTC) and organized by Linköping University.

We cordially invite you to participate and submit your contribution to ETW'01, which includes (but is not limited to) the following topics:

Defect-oriented, Mixed-Signal and Analog Test:

  • Failure Analysis, Defect and Fault Modeling
  • Yield Analysis
  • IDDX Test
  • Analog, Mixed-Signal and RF Test
  • Thermal Testing
  • Signal Integrity Test


Design-for-Testability and BIST:

  • Scan-based Techniques and Boundary Scan
  • High Level DfT
  • On-Line and Off-Line BIST
  • Test Synthesis and Synthesis for Testability
  • Defect/Fault Tolerance and Reliability
  • Self-Repair Methodologies

System Test:

  • Test of Embedded Cores and System-on-Chip
  • Test of MCMs and Boards
  • Multi-Board System Test
  • Micro-System Test
  • Manufacturing Test

ATPG and Fault Simulation:

  • ATPG and High Level TPG
  • Fault Simulation
  • Debug and Diagnosis
  • Test of Memories, Microprocessors, Programmable Logic, MEMs