General Info


 Call for Participation


 Call for Papers


 Author Instructions


  ETW'03 Program


 ETW'03 Registration


 Conference Location

8th IEEE European Test Workshop

 Crowne Plaza Hotel Maastricht,
The Netherlands

May 25 – 28, 2003

ETW'03 Tutorials

 

ETW’03 offers two full-day TTEP 2003 tutorials on May 25.

 

 

Testing (Embedded) Memories: New Fault Models, Tests, DfT, BIST, BISR, and Industrial Results,
by Ad J. van de Goor (Delft University of Technology).

  • Intended audience: Memory and ASIC designers, test algorithm and program developers, researchers and managers of systems using (embedded) memories.

  • Summary: This tutorial addresses the more advanced topics of testing memories. SPICE simulation of defects inserted into the electrical designs of SRAMs and DRAMs is used to show the value of current fault models and to establish many new fault models. The likelihood of the modeled faults is determined, based on SPICE simulation and Inductive Fault Analysis. The space of all functional faults is shown; it indicates the existence of many new functional faults. Traditional tests, such as SCAN, Checkerboard, GALPAT, and Walking 1/0 are covered, followed by the conventional march tests, such as MATS+, March C-, MOVI, etc., and the new march tests for several of the new fault models; their effectiveness will be illustrated, using industrial test data. The intra-word coupling fault model, specific for word-oriented memories, will be introduced together with an optimal set of data backgrounds and a test approach for detecting those faults. Fault models, specific for two-port memories, based on the notion of combinations of weak faults, their probability of occurrence, and two tests are derived. A good portion of the time is devoted to DfT, BIST, and BISR techniques; industrial examples are used to illustrate the most important concepts. Last, a method for designing an optimal set of tests for high volume products, such as microprocessors and commodity SRAMs and DRAMs, will be presented, based on the industrial evaluation of a large set of tests, applied to a large set of DRAM chips, whereby an extensive set of stress combinations (such as address orders, data backgrounds, voltage and temperature stresses) are used.

  • Keywords: Defects, SPICE simulation, inductive fault analysis, fault models, weak faults, March tests,
    addressing schemes, data backgrounds, word-oriented memories, two-port memories, stresses.

 

Defect-Oriented Testing, by Peter Maxwell (Agilent Technologies) and Rob Aitken (Artisan Components).

  • Intended audience: Design, test and manufacturing engineers and managers, students and professors who would like to learn more about defect-oriented testing.

  • Summary: The goal of this tutorial is to expose attendees to the concepts of defect-oriented testing at a level which will both enable rapid implementation and provide insights to assist in improving and extending the methods into future designs and technologies. The tutorial starts with an overview of defect-oriented testing, describes the physical characteristics and electrical effects of CMOS IC defects and failure mechanisms, and shows methods that can be effective in detecting them. The need for fault models is discussed, and model validation and test generation processes are identified. It is shown how to apply defect-oriented test in production, and what the benefits are of the defect-oriented test strategy in improving product quality and lowering cost. Finally, future trends in CMOS technologies are examined and nanotechnologies are explored as a potential alternative, describing defects and test approaches.

  • Keywords: defect-oriented test, realistic fault models, non-standard test techniques, iddq testing, VLV testing, nanotechnologies