CALL FOR PAPERS
 
The IEEE European Test Symposium (ETS), formerly the European Test Workshop (ETW), is a well-recognized forum for presenting and discussing hot topics, trends, emerging results, and practical applications in the area of electronic-based device, board and system testing. The symposium will be co-sponsored by the IEEE Computer Society - Test Technology Technical Council (TTTC) and the LIRMM

We cordially invite you to participate and submit your contribution to ETS’04, which includes (but is not limited to) the following topics:
   
  • Analog, Mixed-Signal, and RF Test
  • ATE Hardware and Software
  • ATPG and High-Level TPG
  • Current based testing
  • Debug and Diagnosis
  • Defect/Fault Tolerance and Reliability
  • Design Verification/Validation
  • Emerging Testability Standards
  • Failure Analysis, Defect and Fault Modeling
  • Fault Simulation
  • FPGA Test
  • High-Level DfT
  • Low-Cost Testers
  • Memory and Processor Test
  • MEMS Testing
  • On-Line and Off-Line BIST
  • Power issues in testing
  • Scan-Based Techniques and Boundary Scan
  • Self-Repair Methodologies
  • Signal Integrity Test
  • System Test
  • Test of Embedded Cores and System-on-Chip
  • Test of MCMs and Boards
  • Test Resource Partitioning and Embedded Test
  • Test Synthesis and Synthesis for Testability
  • Thermal Testing
  • Yield Analysis and Enhancement
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    Submissions
     
    ETS’04 seeks sereval types of contributions, including Research Contributions, Application Contributions, Emerging Ideas Contributions, PhD student forum Contributions, ...
     
    Electronic submission in PDF via the symposium web page is required. Please, see the author instructions for review criteria and publication details.
     
    Proceedings
     
    The IEEE Computer Society will publish formal proceedings of the symposium papers. However, due to the unique format of the event enabling informal presentations (see publication policy), an informal digest of these presentations will be distributed at the symposium. The best contributions will be selected for submission to regular issues of the Journal of Electronic Testing: Theory and Applications (JETTA), published by Kluwer Academic Publishers.
     
    Tutorials
     
    IEEE TTTC Test Technology Educational Program (TTEP) 2004 tutorials will be offered during May 23 on emerging test technology topics. Tutorial proposals should be submitted according to the guidelines at http://tab.computer.org/tttc/teg/ttep.
     
    Deadlines
     
  • Submission deadline: February 1st, 2004
  • Notification of acceptance: March 24th, 2004
  • Camera ready: April 18th, 2004
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    Further Information
     
     

    Michel RENOVELL – General Chair
    LIRMM
    161, rue ADA
    34 392 MONTPELLIER CEDEX 5
    FRANCE
    Tel: (33) 467 418523
    Fax: (33) 467 418500
    Email: renovell@lirmm.fr

    		 Paolo PRINETTO – Program Chair
    Politecnico di Torino
    Dipartimento di Automatica e Informatica
    Corso degli Abruzzi, 24
    I-10129 Torino TO Italy
    Tel.: +39-011-564.7007
    Fax: +39-011-564.7099
    E-mail: Paolo.Prinetto@polito.it
         
    The 2004 edition of the symposium will take place in the beautiful city of Ajaccio. Corsica is a wonderfully enigmatic country. Its attraction lies in nature, sun, and sea, not in artifact. It is a rock-hard fragile paradise. Its poets and singers are nearest to revealing its secrets.
     
    Organizing Committee
     
    LIRMM (F):        Chair: P. Girard
    Registration: P. Nouet         Web: F. Azais, A. Benzo
    Publicity: ML. Flottes          Finance: S. Pravossoudovitch, B. Rouzeyre
    Proceedings: S. Bernard, L. Latorre, A. Virazel