Monday Program

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UTC+2 Monday May 24, 2021
14:00 – 14:30 Opening
14:30 – 15:30
Keynote Address
Building and Validating Advanced Quantum Systems
Oliver DIAL

Distinguished Research Staff Member, IBM TJ Watson Research Center, Yorktown Heights, NY, USA
Moderator: Georges Gielen
15:30 – 16:30 Session 1 – Test Generation
Chair(s): Daniel Tille
15:30 – 15:50 S1-1 Speeding Up Cell-Aware Library Characterization by Preceding Simulation with Structural Analysis, Francesco LORENZELLI (University of Bologna – Italy), Zhan GAO (IMEC – Belgium), Joe SWENTON, Santosh MALAGI (Cadence Design Systems – United States), Erik Jan MARINISSEN (IMEC – Belgium)
15:50 – 16:10 S1-2 (CS) Testing Embedded Toggle Pattern Generation Through On-Chip IR Drop Monitoring, Kazuki MONTA (Graduate School of Science, Technology and Innovation, Kobe University, Kobe, Japan – Japan), Leonidas KATSELAS (Aristotle University of Thessaloniki – Greece), Ferenc FODOR (IMEC – Belgium), Alkis HATZOPOULOS (Aristotle University of Thessaloniki – Greece), Makoto NAGATA (Kobe University – Japan), Erik Jan MARINISSEN (IMEC – Belgium)
16:10 – 16:30 S1-3 Unsupervised Learning in Test Generation for Digital Integrated Circuits, Soham ROY, Spencer MILLICAN, Vishwani AGRAWAL (Auburn University – United States)
Special Session 1 – Exploring and Comparing IEEE P1687.1 and IEEE 1687 Modeling and Implementation of NON-TAP Interfaces
Organisers: Martin KEIM, Jeff REARICK
15:30 – 16:30 SP1-1 Hans-Martin VON STAUDT (Dialog Semiconductor – Germany)
Jeff REARICK (Advanced Micro Devices – USA)
Michele PORTOLAN (Univ Grenoble Alpes, CNRS, Grenoble INP1, TIMA – France)
Martin KEIM (Siemens Digital Industries Software – USA)
Industry Session 1 – Diagnosing Failing Mixed-Signal ICs
Chair(s): Haralampos Stratigopoulos, Stephen Sunter
15:30 – 15:50 IS1-1 Diagnosis of SAR-ADC INL/DNL Failures using Capacitor Matching Techniques, Stefano ROGGI, Peter BOGNER, Rocco CALABRO, Josef NIEDERL, Dario VAGNI, Andreas FUGGER (Infineon Technologies – Austria), Jaafar MEJRI, Ralf ARNOLD (Infineon Technologies – Germany)
15:50 – 16:10 IS1-2 Defect Oriented Diagnostic For Analog: Why Building a Defect Oriented Test Database Matters, Jo GUNNES (NXP Semiconductors – Netherlands)
16:10 – 16:30 IS1-3 Automated Analog Fault Simulators: Application to Failure Analysis, Tommaso MELIS (ST Microelectronics – Italy)
16:30 – 17:00 Break & Vendor Booths
17:00 – 18:00 Session 2 – AMS-RF
Chair(s): Gildas Leger & Artur Pogiel
17:00 – 17:20 S2-1 Exploration of a digital-based solution for the generation of 2.4GHz OQPSK test stimuli, Thibault VAYSSADE, Mouhamad CHEHAITLY (Univ. Montpellier, CNRS, LIRMM – France), Florence AZAIS (Univ. Montpellier, CNRS – France), Laurent LATORRE (LIRMM – France), Francois LEFEVRE (NXP, FR – France)
17:20 – 17:40 S2-2 BIST-Assisted Analog Fault Diagnosis, Antonios PAVLIDIS (Sorbonne Univ., CNRS, LIP6 – France), Eric FAEHN (STM – France), Marie-Minerve LOUERAT (Sorbonne Université – CNRS – France), Haralampos STRATIGOPOULOS (Sorbonne Univ., CNRS, LIP6 – France)
17:40 – 18:00 S2-3 Analysis and mitigation of timing inaccuracies in high-frequency on-chip sinusoidal signal generators based on harmonic cancellation, Ankush MAMGAIN, Manuel BARRAGAN, Salvador MIR (TIMA Laboratory – France)
Special Session 2 – Emerging Computing Devices: Challenges and Opportunities for Test and Reliability
Organizer: Alberto BOSIO
17:00 – 17:20 SP2-1 Quantum Accelerators: from quantum application to simulator execution, Koen Bertels (Qbee and University of Porto – Portugal)
17:20 – 17:40 SP2-2 Dependability for AI Hardware Architectures, Muhammad Shafique (New York University Abu Dhabi – UAE)
17:40 – 18:00 SP2-3 Approximation-Based Fully Reliable TMR Alternative for Safety-Critical Applications, Marcello Traiola (Ecole Centrale de Lyon – France)
Industry Session 2 – Solutions for preventing latent defects from causing system faults
Chair(s): Riccardo Cantoro & Mark Zwolinski
17:00 – 17:20 IS2-1 From Screening Latent Defects Towards Auto Correction, Ronny VANHOOREN, Anthony COYETTE, Wim DOBBELAERE (ON Semiconductor – Belgium) Jhon GOMEZ, Nektar XAMA, Georges GIELEN (KU Leuven – Belgium)
17:20 – 17:40 IS2-2 Automotive Quality Requirements and Industrial Volume Production: Zero Defect Meets the Real World, Ralf MONTINO, Christian THUM (Elmos Semiconductor)
17:40 – 18:00 IS2-3 Techniques to Mitigate Latent Defects in the Digital World, Jeff REARICK (Advanced Micro Devices – United States)
18:00 – 19:00 Session 3 – Standards
Chair(s): Michele Portolan & Pete Harrod
18:00 – 18:20 S3-1 System-Level Access to On-Chip Instruments, Erik LARSSON, Shashi Kiran GANGARAJU, Prathamesh MURALI (Lund University – Sweden)
18:20 – 18:40 S3-2 (CS) Applying IEEE 1838 to the 3DIC Design Trishul – A Case Study, Teresa MCLAURIN (ARM – United States), Frank FREDERICK, Saurabh SINHA, Heath PERRY, Shawn HUNG (Arm – United States)
18:40 – 18:45 S3-3 (P) A Tutorial of How to Ensure High Automotive Microcontroller Quality, Ralf ARNOLD (Infineon Technologies – Germany)
18:45 – 18:50 S3-4 (P) A 3DIC interconnect interface test and repair scheme based on Hybrid IEEE1838 Die Wrapper Register and BIST circuit, Changming CUI, Junlin HUANG (Hisilicon – China)
Session 4 – Hardware Security
Chair(s): Giorgio Di Natale & Adam Cron
18:00 – 18:20 S4-1 Compact Protection Codes for protecting memory from malicious data and address manipulations, Gilad DAR, Avihay GRIGIAC, Yagel ASHKENAZI, David PELED (Bar-Ilan University – Israel), Menachem GOLDZWEIG (biu university – Israel), Yoav WEIZMAN, Osnat KEREN (Bar-Ilan University – Israel)
18:20 – 18:40 S4-2 RHAT: Efficient RowHammer-Aware Test for Modern DRAM Modules, Mohammad FARMANI, Mark TEHRANIPOOR, Fahim RAHMAN (University of Florida – United States)
18:40 – 18:45 S4-3 (P) Opacity preserving Countermeasure using Finite State Machines against Differential Scan Attacks, Sk. Subidh ALI (IIT Bhilai – India), Yogendra SAO (Indian Institute of Technology Bhilai – India), Santosh BISWAS (IIT Bhilai – India)
18:45 – 18:50 S4-4 (P) Trustworthy computing on untrustworthy and Trojan-infected on-chip interconnects, Heba SALEM, Nigel TOPHAM (The University of Edinburgh – United Kingdom)
18:50 – 18:55 S4-5 (P) Chill Out: Freezing Attacks on Capacitors and DC/DC Converters, Obi NNOROM JR, Jalil MORRIS (Yale University – United States), Ilias GIECHASKIEL (Independent Researcher – United Kingdom), Jakub SZEFER (Yale University – United States)
18:55 – 19:00 S4-6 (P) Transit-Guard: An OS-based Defense Mechanism Against Transient Execution Attacks, Maria MUSHTAQ, David NOVO (LIRMM – France), Florent BRUGUIER, Pascal BENOIT (Universite de Montpellier – France), Muhammad Khurram BHATTI (Information Technology University – Pakistan)
Vendor Session 1: Test Equipment
Moderator(s): Bram Kruseman & Hans Manhaeve
18:00 – 18:20 VS1-1 Solving Test Challenges of State-of-the-Art Power Devices, Thomas KOEHLER, Dennis KEOGH, Chuck CARLINE (Teradyne – United States)
18:20 – 18:40 VS1-2 Keysight’s Massively Parallel Board Test System, Sivakumar VIJAYAKUMAR (Keysight Technologies – Singapore)
18:40 – 19:00 VS1-3 Improving Reliability Insights Through Cost-Effective, Flexible Parallel WLR Systems, Joris DONDERS (NI – Belgium)
Regular Session (S)
Special Session (SP)
Embedded Tutorial (ET)
Industry Session (IS)
McCluskey Award
PhD Forum & Poster Session
Vendor Session
Regular Paper
(CS) Case Study Paper
(HT) Hot Topic Paper
(P) Poster
Best paper candidate