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| UTC+2 | Monday May 24, 2021 | ||
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| 14:00 – 14:30 | Opening | ||
| 14:30 – 15:30 |
Keynote Address Building and Validating Advanced Quantum Systems Oliver DIAL Distinguished Research Staff Member, IBM TJ Watson Research Center, Yorktown Heights, NY, USA Moderator: Georges Gielen |
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| 15:30 – 16:30 |
Session 1 – Test Generation Chair(s): Daniel Tille |
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| 15:30 – 15:50 | S1-1 | ★ Speeding Up Cell-Aware Library Characterization by Preceding Simulation with Structural Analysis, Francesco LORENZELLI (University of Bologna – Italy), Zhan GAO (IMEC – Belgium), Joe SWENTON, Santosh MALAGI (Cadence Design Systems – United States), Erik Jan MARINISSEN (IMEC – Belgium) | |
| 15:50 – 16:10 | S1-2 | (CS) Testing Embedded Toggle Pattern Generation Through On-Chip IR Drop Monitoring, Kazuki MONTA (Graduate School of Science, Technology and Innovation, Kobe University, Kobe, Japan – Japan), Leonidas KATSELAS (Aristotle University of Thessaloniki – Greece), Ferenc FODOR (IMEC – Belgium), Alkis HATZOPOULOS (Aristotle University of Thessaloniki – Greece), Makoto NAGATA (Kobe University – Japan), Erik Jan MARINISSEN (IMEC – Belgium) | |
| 16:10 – 16:30 | S1-3 | Unsupervised Learning in Test Generation for Digital Integrated Circuits, Soham ROY, Spencer MILLICAN, Vishwani AGRAWAL (Auburn University – United States) | |
Special Session 1 – Exploring and Comparing IEEE P1687.1 and IEEE 1687 Modeling and Implementation of NON-TAP Interfaces Organisers: Martin KEIM, Jeff REARICK |
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| 15:30 – 16:30 | SP1-1 | Hans-Martin VON STAUDT (Dialog Semiconductor – Germany) | |
| Jeff REARICK (Advanced Micro Devices – USA) | |||
| Michele PORTOLAN (Univ Grenoble Alpes, CNRS, Grenoble INP1, TIMA – France) | |||
| Martin KEIM (Siemens Digital Industries Software – USA) | |||
Industry Session 1 – Diagnosing Failing Mixed-Signal ICs Chair(s): Haralampos Stratigopoulos, Stephen Sunter |
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| 15:30 – 15:50 | IS1-1 | Diagnosis of SAR-ADC INL/DNL Failures using Capacitor Matching Techniques, Stefano ROGGI, Peter BOGNER, Rocco CALABRO, Josef NIEDERL, Dario VAGNI, Andreas FUGGER (Infineon Technologies – Austria), Jaafar MEJRI, Ralf ARNOLD (Infineon Technologies – Germany) | |
| 15:50 – 16:10 | IS1-2 | Defect Oriented Diagnostic For Analog: Why Building a Defect Oriented Test Database Matters, Jo GUNNES (NXP Semiconductors – Netherlands) | |
| 16:10 – 16:30 | IS1-3 | Automated Analog Fault Simulators: Application to Failure Analysis, Tommaso MELIS (ST Microelectronics – Italy) | |
| 16:30 – 17:00 | Break & Vendor Booths | ||
| 17:00 – 18:00 |
Session 2 – AMS-RF Chair(s): Gildas Leger & Artur Pogiel |
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| 17:00 – 17:20 | S2-1 | ★ Exploration of a digital-based solution for the generation of 2.4GHz OQPSK test stimuli, Thibault VAYSSADE, Mouhamad CHEHAITLY (Univ. Montpellier, CNRS, LIRMM – France), Florence AZAIS (Univ. Montpellier, CNRS – France), Laurent LATORRE (LIRMM – France), Francois LEFEVRE (NXP, FR – France) | |
| 17:20 – 17:40 | S2-2 | BIST-Assisted Analog Fault Diagnosis, Antonios PAVLIDIS (Sorbonne Univ., CNRS, LIP6 – France), Eric FAEHN (STM – France), Marie-Minerve LOUERAT (Sorbonne Université – CNRS – France), Haralampos STRATIGOPOULOS (Sorbonne Univ., CNRS, LIP6 – France) | |
| 17:40 – 18:00 | S2-3 | Analysis and mitigation of timing inaccuracies in high-frequency on-chip sinusoidal signal generators based on harmonic cancellation, Ankush MAMGAIN, Manuel BARRAGAN, Salvador MIR (TIMA Laboratory – France) | |
Special Session 2 – Emerging Computing Devices: Challenges and Opportunities for Test and Reliability Organizer: Alberto BOSIO |
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| 17:00 – 17:20 | SP2-1 | Quantum Accelerators: from quantum application to simulator execution, Koen Bertels (Qbee and University of Porto – Portugal) | |
| 17:20 – 17:40 | SP2-2 | Dependability for AI Hardware Architectures, Muhammad Shafique (New York University Abu Dhabi – UAE) | |
| 17:40 – 18:00 | SP2-3 | Approximation-Based Fully Reliable TMR Alternative for Safety-Critical Applications, Marcello Traiola (Ecole Centrale de Lyon – France) | |
Industry Session 2 – Solutions for preventing latent defects from causing system faults Chair(s): Riccardo Cantoro & Mark Zwolinski |
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| 17:00 – 17:20 | IS2-1 | From Screening Latent Defects Towards Auto Correction, Ronny VANHOOREN, Anthony COYETTE, Wim DOBBELAERE (ON Semiconductor – Belgium) Jhon GOMEZ, Nektar XAMA, Georges GIELEN (KU Leuven – Belgium) | |
| 17:20 – 17:40 | IS2-2 | Automotive Quality Requirements and Industrial Volume Production: Zero Defect Meets the Real World, Ralf MONTINO, Christian THUM (Elmos Semiconductor) | |
| 17:40 – 18:00 | IS2-3 | Techniques to Mitigate Latent Defects in the Digital World, Jeff REARICK (Advanced Micro Devices – United States) | |
| 18:00 – 19:00 |
Session 3 – Standards Chair(s): Michele Portolan & Pete Harrod |
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| 18:00 – 18:20 | S3-1 | ★ System-Level Access to On-Chip Instruments, Erik LARSSON, Shashi Kiran GANGARAJU, Prathamesh MURALI (Lund University – Sweden) | |
| 18:20 – 18:40 | S3-2 | (CS) Applying IEEE 1838 to the 3DIC Design Trishul – A Case Study, Teresa MCLAURIN (ARM – United States), Frank FREDERICK, Saurabh SINHA, Heath PERRY, Shawn HUNG (Arm – United States) | |
| 18:40 – 18:45 | S3-3 | (P) A Tutorial of How to Ensure High Automotive Microcontroller Quality, Ralf ARNOLD (Infineon Technologies – Germany) | |
| 18:45 – 18:50 | S3-4 | (P) A 3DIC interconnect interface test and repair scheme based on Hybrid IEEE1838 Die Wrapper Register and BIST circuit, Changming CUI, Junlin HUANG (Hisilicon – China) | |
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Session 4 – Hardware Security Chair(s): Giorgio Di Natale & Adam Cron |
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| 18:00 – 18:20 | S4-1 | Compact Protection Codes for protecting memory from malicious data and address manipulations, Gilad DAR, Avihay GRIGIAC, Yagel ASHKENAZI, David PELED (Bar-Ilan University – Israel), Menachem GOLDZWEIG (biu university – Israel), Yoav WEIZMAN, Osnat KEREN (Bar-Ilan University – Israel) | |
| 18:20 – 18:40 | S4-2 | RHAT: Efficient RowHammer-Aware Test for Modern DRAM Modules, Mohammad FARMANI, Mark TEHRANIPOOR, Fahim RAHMAN (University of Florida – United States) | |
| 18:40 – 18:45 | S4-3 | (P) Opacity preserving Countermeasure using Finite State Machines against Differential Scan Attacks, Sk. Subidh ALI (IIT Bhilai – India), Yogendra SAO (Indian Institute of Technology Bhilai – India), Santosh BISWAS (IIT Bhilai – India) | |
| 18:45 – 18:50 | S4-4 | (P) Trustworthy computing on untrustworthy and Trojan-infected on-chip interconnects, Heba SALEM, Nigel TOPHAM (The University of Edinburgh – United Kingdom) | |
| 18:50 – 18:55 | S4-5 | (P) Chill Out: Freezing Attacks on Capacitors and DC/DC Converters, Obi NNOROM JR, Jalil MORRIS (Yale University – United States), Ilias GIECHASKIEL (Independent Researcher – United Kingdom), Jakub SZEFER (Yale University – United States) | |
| 18:55 – 19:00 | S4-6 | (P) Transit-Guard: An OS-based Defense Mechanism Against Transient Execution Attacks, Maria MUSHTAQ, David NOVO (LIRMM – France), Florent BRUGUIER, Pascal BENOIT (Universite de Montpellier – France), Muhammad Khurram BHATTI (Information Technology University – Pakistan) | |
Vendor Session 1: Test Equipment Moderator(s): Bram Kruseman & Hans Manhaeve |
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| 18:00 – 18:20 | VS1-1 | Solving Test Challenges of State-of-the-Art Power Devices, Thomas KOEHLER, Dennis KEOGH, Chuck CARLINE (Teradyne – United States) | |
| 18:20 – 18:40 | VS1-2 | Keysight’s Massively Parallel Board Test System, Sivakumar VIJAYAKUMAR (Keysight Technologies – Singapore) | |
| 18:40 – 19:00 | VS1-3 | Improving Reliability Insights Through Cost-Effective, Flexible Parallel WLR Systems, Joris DONDERS (NI – Belgium) | |
| Legend | |
|---|---|
| Regular Session (S) | |
| Special Session (SP) | |
| Embedded Tutorial (ET) | |
| Industry Session (IS) | |
| McCluskey Award | |
| PhD Forum & Poster Session | |
| Keynote | |
| Panel | |
| Vendor Session | |
| Regular Paper | |
| (CS) | Case Study Paper |
| (HT) | Hot Topic Paper |
| (P) | Poster |
| ★ | Best paper candidate |