Program Overview - ETS 2021

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UTC+2	Monday May 24, 2021			Tuesday May 25, 2021			Wednesday May 26, 2021			Thursday May 27, 2021	UTC+2
14:00 – 14:30	Opening			Keynote 2 – From wearables to ingestibles and invisibles: disruptive new health devices and their path to maturity & the market – Chris VAN HOOF			S9 – Miscellaneous	SP3 – Recent Advances on Photonic Physical Unclonable Functions	Vendor Session 4 – Innovative Test Approaches	Keynote 4 – Secure hardware design: starting from the roots of trust – Ingrid VERBAUWHEDE	14:00 – 14:30
14:30 – 15:00	Keynote 1 – Building and Validating Advanced Quantum Systems – Oliver DIAL						S9 – Miscellaneous		Vendor Session 4 – Innovative Test Approaches		14:30 – 15:00
15:00 – 15:30				S5 – Memory Test & Reliability	IS3 – Analog Defect Simulation in Industry	E. J. McCluskey Best Doctoral Thesis Award at ETS	ET1 – Speed-path Validation, Silicon Debug, Delay Test	ET2 – Security and Resilience of Quantum Computing	ET3 – Analog Test Automation – An Overview of IEEE P1687.2	Panel – Design and Manufacturing Technology of Advanced Multi-Die Packages on the ‘Slope of Enlightenment’: Where Is 3D-Test?	15:00 – 15:30
15:30 – 16:00	S1 – Test Generation	SP1 – Exploring and Comparing IEEE P1687.1 and IEEE 1687 Modeling and Implementation of NON-TAP Interfaces	IS1 – Diagnosing Failing Mixed-Signal ICs	S5 – Memory Test & Reliability	IS3 – Analog Defect Simulation in Industry		ET1 – Speed-path Validation, Silicon Debug, Delay Test	ET2 – Security and Resilience of Quantum Computing	ET3 – Analog Test Automation – An Overview of IEEE P1687.2		15:30 – 16:00
16:00 – 16:30	S1 – Test Generation		IS1 – Diagnosing Failing Mixed-Signal ICs	Break + Vendor Booths			Break + Vendor Booths			McCluskey Award & Closing Session	16:00 – 16:30
16:30 – 17:00	Break + Vendor Booths			S6 – Sensors and Monitors for safety and security	Vendor Session 2 – OpenTAP Tutorial		Keynote 3 – A Cambrian Explosion in Electronic System Testing is Dead Ahead – Subhasish MITRA			Global Test Community Quiz (GTCQ)	16:30 – 17:00
17:00 – 17:30	S2 – AMS-RF	SP2 – Emerging Computing Devices: Challenges and Opportunities for Test and Reliability	IS2 – Solutions for Preventing Latent Defects from Causing System Faults	S6 – Sensors and Monitors for safety and security	Vendor Session 2 – OpenTAP Tutorial						17:00 – 17:30
17:30 – 18:00	S2 – AMS-RF			Break + Vendor Booths			PhD Forum & Posters & McCluskey Award				17:30 – 18:00
18:00 – 18:30	S3 – Standards	S4 – Hardware security	Vendor Session 1 – Test Equipment	S7 – Miscellaneous	S8 – Quantum	Vendor Session 3 – Wafer Probe Technology	PhD Forum & Posters & McCluskey Award				18:00 – 18:30
18:30 – 19:00	S3 – Standards	S4 – Hardware security	Vendor Session 1 – Test Equipment	S7 – Miscellaneous	S8 – Quantum	Vendor Session 3 – Wafer Probe Technology	S10 – Non-Volatile Memories	SP4 – Security, Reliability and Test Aspects of the RISC-V Ecosystem	Vendor Session 5 – EDA		18:30 – 19:00
19:00 – 19:30	Author Interview session + Wonder.me			Author Interview session + Wonder.me			S10 – Non-Volatile Memories		Vendor Session 5 – EDA		19:00 – 19:30
19:30 – 20:00	Author Interview session + Wonder.me			Author Interview session + Wonder.me			Author Interview session + Wonder.me				19:30 – 20:00

Legend
Regular Session (S)
Special Session (SP)
Embedded Tutorial (ET)
Industry Session (IS)
McCluskey Award
PhD Forum & Poster Session
Keynote
Panel
Vendor Session
Regular Paper
(CS)	Case Study Paper
(HT)	Hot Topic Paper
(P)	Poster
★	Best paper candidate