IEEE Computer Society

ETW'96 IEEE European Test Workshop Montpellier (Hotel La Corniche in Sète), France June 14 - 16, 1996

• Call for Participation
• Organisation Committee
• Program Committee

Call for Participation

The European Test Workshop will create a forum that discusses developing trends and the state-of-the-art in the area of electronic circuit and system testing. European companies are increasing their competetiveness and reducing Time-to-Market by widely applying test automation techniques, and European research institutions are providing well recognized contributions to this field. You are all invited to submit your work to the IEEE European Test Workshop which continues and substitutes the former European DFT Workshop.
The topics include but are not limited to:

• Test Automation
• DFT and BIST
• ATPG and Fault Simulation
• IDDQ Testing
• ATE
• Synthesis for Testability
• Online Test
• Defect Analysis
• Mixed-Signal and Analog Testing
• Test Quality and Test Economics

The program committee invites original presentations in these areas. Each submission should include a 50-word abstract and a list of keywords, and may be a full paper or an extended summary. Also identify a contact author and include a complete mailing address, phone number, fax number and E-mail address. Submitted materials may be included in an informal workshop proceedings. If you wish to submit a presentation, please observe the following deadlines:

• Submission deadline: February 28, 1996
• Notification of acceptance: April 15, 1996

For general information, contact:

Submit paper proposals to:

The European Test Workshop is sponsored by the IEEE Computer Society Test Technology Technical Committee in cooperation with the European Test Technology Technical Committee (ETTTC). It is also sponsored by the Laboratoire d'Informatique, de Robotique et de Microélectronique de Montpellier (LIRMM - UMR 9928 Univ. Montpellier II / CNRS).

For participants coming by train or plane, a shuttle service will be arranged. Several bus will pick up the participants in the Montpellier rail station and in the Montpellier-Fréjorgues airport to go to Sète.

Organisation committee

General Chair

C. Landrault LIRMM - France

Vice General Chair

P. Prinetto Politecnico di Torino - Italy

Program Chairs

H.J. Wunderlich U of Siegen - Germany
K. Baker Philips - Netherlands

IEEE-CS Liaison

T.W. Williams IBM - USA

Finance

S. Pravossoudovitch LIRMM - France

Local Arrangements

Y. Bertrand LIRMM - France

Publicity

M. Nicolaidis TIMA/INPG - France

Registration

B. Rouzeyre LIRMM - France

Program Committee

E.J. Aas - U of Trondheim - N
S. Barbagallo - Italtel - I
R.G. Bennets - Synopsys - UK
B. Courtois - TIMA CMP - F
J. Figueras - U of Catalunya - SP
H. Fujiwara - NAIST - J
C. Gauthron - Compass - F
S. Griep - Siemens - Germany
J. Hlavicka - U of Czech - Cz
A. Hlawiczka - U of Gliwice - PL
H. Kerkhoff - U of Twente - NL
G. Krueger - SNI - D
C.L. Barrio - Telefonica I&D - SP
D. Medina - Italtel - I
H. Manhaeve - KIHWV - B
P.W. Olivo - U di Bologna - I
A. Paschalis - NCSR - GR
M. Renovell - LIRMM - F
J.P. Teixeira - INESC - P
R. Ubar - U of Tallinn - EE
R. Wagner - Bosch GmbH - Germany
M. Wahl - U of Siegen - Germany
T.W. Williams - IBM - USA
Y. Zorian - AT&T Bell Lab - USA