ETW 2000
IEEE European Test Workshop
Atlantic Gardens Hotel, Cascais, Portugal 

May 23-26, 2000

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Organizing Committee Steering Committee Program Committee
General Chair / Vice-Chair
J. P. Teixeira - IST/INESC (P) 
Z. Peng - U. Linkoping (S)
Program Chair / Vice Chair
P. Prinetto - Politecnico di Torino (I) 
J. Figueras - U. Catalunya (E)
Publicity Chair
H. Manhaeve - Q-Star Test (B)
Panel Chair
H.-J- Wunderlich U. Stuttgart (D)
Tutorials Chair
C. Landrault - LIRMM (F)
Industrial Relations Chair
B. Bennetts - Ben. Assoc. (UK)
Local Chair/Vice Chair
C.F.B. Almeida - IST/INESC (P)
J.M. Ferreira - FEUP (P)
Finance Chair
F.M. Gonçalves - IST/INESC (P)
Publications Chair/Vice Chair
I.M. Teixeira - IST/INESC (P)
M.L. Flottes - LIRMM (F)
Asia-Pacific Liasion
K. Kinoshita - Osaka Un. (Japan)
Latin America Liasion
F. Vargas - PUCR (Brazil)
North America Liasion
V. Agrawal - Bell Labs (USA)		 B. Bennetts - Bennetts Assoc. (UK)
G. Carlsson - Ericsson (S) 
J. Figueras - U Polit. de Catalunya (E) 
C. Landrault - LIRMM (F) 
E.J. Marinissen - Philips (NL) 
P. Muhmentaler - Infineon Techn. (D) 
Z. Peng - U of Linkoping (S) 
P. Prinetto - Politecnico di Torino (I) 
J. P. Teixeira - IST/INESC (P)
H.-J. Wunderlich - U of Stuttgart (D) 
Y. Zorian - Logic Vision (USA)
Topic Coordinators

C. Landrault  - LIRMM (F) 
E.J. Marinissen  - Philips (NL)
A. Rubio - U Polit. de Catalunya (E)
H.-J. Wunderlich  - U of Stuttgart (D)
 

Members

E.J. Aas - Norw. U of Science (N) 
K. Baker - Philips (NL) 
B. Becker - U of Freiburg (D) 
B. Bennetts - Bennetts Assoc. (UK) 
B. Courtois - TIMA CMP (F) 
W. Daehn - Hochschule Wismar (G)
C. Ellingham - Synopsys (USA) 
J. Figueras - U Polit.de Catalunya (E) 
H. Fujiwara - NIST 
D. Gizopoulos - University of Piraeus (G) 
S. Hellebrand - U of Innsbrusk (A) 
M. Hirech - Synopsys (USA) 
J. Hlavicka - Czech Technical U (CZ) 
A. Hlawiczka - U of Gliwice (PL) 
H. Kerkhoff - U of Twente (NL) 
M. Lobetti Bodoni - Siemens ICN (I) 
M. Lubaszewski - UFRGS (BR) 
H. Manhaeve - Q-Star Test (B) 
L. Miclea - U of Cluj-Napoca (RO) 
S. Motto - CAEN (I) 
J. Mucha - U of Hannover (D) 
M. Nicolaidis - TIMA CMP (F) 
M. Ohletz - ALCATEL (B) 
P. Olivo - U of Ferrara (I) 
A. Osseiran - Fluence (CH) 
A. Paschalis - NCSR (GR) 
Z. Peng - U of Linkoping (S) 
P. Prinetto - Politecnico di Torino (I) 
M. Renovell - LIRMM (F) 
A. Richardson -U Lancaster (UK) 
C. Robach - ESISAR (F) 
R. Roy - Intel (USA) 
M.Sachdev - U of Waterloo (CAN) 
P. Sanchez - U de Cantabria (E) 
R. Segers - Philips Semicond. (NL) 
M. Sonza Reorda - Polit. di Torino (I) 
M. Spadari - LSI Logic (I) 
J. P. Teixeira - IST/INESC (P) 
R. Ubar - U of Tallinn (EE) 
T.W. Williams - Synopsys (USA) 
V. Yarmolik - U of Minsk (SU) 
Y. Zorian - LogicVision (USA)

 
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 IEEE European Test Workshop 2000