Session  2A: System Testing		paper
2A.1	A Dependable Software Development Kit for Commercial Applications in Embedded Systems A. Benso - S. Chiusano - P. Prinetto Politecnico di Torino, Italy	PDF
2A.2	A new Compression/Decompression Method for non Correlated Test Patterns: Application to Test Pins Expansion W. Maroufi LIP6 laboratory, France	PDF
2A.3	System-level Test Bench Generation in a Co-design Framework M. Lajolo* - L. Lavagno' - M. Rebaudengo** - M.  M. Sonza Reorda** - M. Violante**     * NEC USA, USA ** Università di Udine, Italy    ' Politecnico di Torino, Italy	PDF