Call for Papers

Call for Papers (version 21, 288 kB)

The IEEE European Test Symposium (ETS) is Europe’s premier forum dedicated to presentingand discussing scientific results, emerging ideas, practical applications, hot topics, and new trendsin the area of electronic-based circuit and system testing. In 2010, ETS will take place in Prague, Czech Republic. ETS’10 is being organized by the Czech Technical University in Prague togetherwith Technical University in Liberec, and is sponsored by the Test Technology Technical Council (TTTC) of the IEEE Computer Society. As a new initiative in 2010, a Test Spring School will beorganized in conjunction with ETS'10.

Topics

You are invited to participate and submit your contributions to ETS'10. The areas of interest include (but are not limited to) the following topics:

  • Automatic Test Generation
  • Fault Modeling and Simulation
  • Current-Based Test
  • Power Issues in Test
  • Thermal Test
  • Delay and Performance Test
  • High-Speed IO/Interconnect Test
  • Signal Integrity Test
  • Nanometer Technologies Test
  • ATE Hardware and Software
  • Standards in Testing
  • Test(ability) Synthesis
  • Built-In Self Test (BIST)
  • Design for Test(ability) (DfT)
  • Test Data Compression
  • On-Line Test
  • Self-Repair Methodologies
  • Test of Reconfigurable Systems
  • Analog, Mixed-Signal, RF Test
  • Memory Test and Repair
  • Microprocessor Test
  • MEMS and Nanotechnology Test
  • Failure Analysis
  • Diagnosis and Debug
  • Design Verification and Validation
  • Test Quality and Reliability
  • Yield Analysis and Enhancement
  • Defect and Fault Tolerance
  • Board and System Test
  • (Embedded) System Test
  • High-Level DfT and TPG
  • System-in-Package (SiP) Test
  • System-on-Chip (SoC) Test

Publications

ETS’10 will produce Formal Proceedings of selected papers and an Informal Digest of Papers. The best contributions will be selected for submission to regular issues of the “Journal of Electronic Testing: Theory and Applications” (JETTA), published by Springer.A Best aper Award of ETS`10 will be presented at ETS’11. P

Submissions

ETS'10 seeks original, unpublished contributions of the following types:

Detailed submission instructions, including selection criteria and publication policies, for the various types of contributions are posted on the ETS'10 web page.

The ETS'10 organizing committee also encourages the organization of fringe meetings and workshops. Details can be found on the ETS`10 web page.

Key Dates

Further Information

15th IEEE European Test Symposium
May 24-28, 2010