3rd International Workshop on Impact of Low-Power design on Test and Reliability LPonTR'10
Prague, Czech Republic, May 27-28, 2010

The International Workshop on Impact of Low Power Design on Test and Reliability (LPonTR) aims to bring together design, reliability and test engineers and researchers to discuss the impact of advanced low-power low-voltage design methodologies of nanometer silicon systems on test and reliability. Power and thermal issues, leakage, process variations, susceptibility to environmental and operation-induced interference are physical constraints that drive the development of low-power, process-tolerant design techniques. However, these techniques generate a new set of test and reliability challenges, questing for an innovative set of methodologies and tools.

Call for Papers (76 kB)

Programme (145 kB)

Doctoral Student Contest
Prague, Czech Republic, May 25-28, 2010

The Award's purpose is to promote most impactful doctoral student work, to provide the doctoral students with the exposure to the community and the prospective employers, and to support interaction between academia and industry in the field of test technology.

Call for Papers (47 kB)

Vendor Session
Prague, Czech Republic, May 25-28, 2010

ETS'10 is offering commercial vendors the opportunity to give technical presentations in a track parallel to the technical paper sessions. These presentations will be listed in the symposium program along with the technical sessions, and should be targeted to the ETS technical audience. The Vendor Sessions differ from other ETS presentations in that company names, logos, and product names may be mentioned explicitly. Typical content could include product descriptions, case studies, best practices, and testimonials.

Presentation opportunities of 30-minute duration are available on a first-come first-served basis, but priority will be given to those companies that are also sponsors of ETS'09 - see below. Attendance at the sessions is open to all symposium attendees, and vendor representatives will be able to hand out literature at the session.

Call for Papers (55 kB)

15th IEEE European Test Symposium
May 24-28, 2010