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| Session 1B: Scan and Functional Testing | paper | slides | |
|---|---|---|---|
1B.1
|
An Experiment To Compare AC Scan and At-Speed Functional Testing P. Maxwell Agilent Technologies, USA |
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1B.2
|
Embedded Test and Debug of
Full Custom and Synthesisable Microprocessor Cores
A. Burdass - G. Campbell - R. Grisenthwaite - D. Gwilt - P. Harrod - R. York ARM Ltd, United Kingdom |
|
|
1B.3
|
Using on-chip Test Pattern
Compression for Full Scan SoC Designs
H. Lang - J. Pfeiffer - J. Maguire Motorola SPS, Germany |
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