|
| Session 7B: Challenges in Deep Sub-Micron Testing | paper | |
|---|---|---|
7B.1&2 |
Test Challenges in Nanometer
Technologies
S. Kundu - S. Sengupta Intel, USA |
|
7B.3 |
Current Testing Procedure
for Deep Submicron Devices
A. Chichkov - D. Merlier - P. Cox Alcatel Microelectronics, Belgium |
|
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