The
IEEE European Test Symposium (ETS) is Europe’s premier forum
dedicated to presenting and discussing scientific results, emerging
ideas, practical applications, hot topics, and new trends in the area
of electronic-based circuit and system testing. In 2008, ETS will take
place in the nice town of Verbania, Piedmont, Lago
Maggiore lakeside. ETS’08 is being organized by the
Politecnico di Torino, and is sponsored by the Test Technology
Technical Council (TTTC) of the IEEE Computer Society.
You are invited to participate
and submit your contributions to ETS’08. The areas of
interest of ETS’08 include (but are not limited to) the
following topics:
•
Automatic Test Generation
• Fault Modeling and Simulation
• Current-Based Test
• Power Issues in Test
• Thermal Test
• Delay and Performance Test
• High-Speed IO/Interconnect Test
• Signal Integrity Test
• Nanometer Technologies Test
• ATE Hardware and Software
• Standards in Testing
•
Test(ability) Synthesis
• Built-In Self Test (BIST)
• Design for Test(ability) (DfT)
• Test Data Compression
• On-Line Test
• Self-Repair Methodologies
• Test of Reconfigurable Systems
• Analog, Mixed-Signal, RF Test
• Memory Test and Repair
• Microprocessor Test
• MEMS and Nanotechnology Test
•
Failure Analysis
• Diagnosis and Debug
• Design Verification and Validation
• Test Quality and Reliability
• Yield Analysis and Enhancement
• Defect and Fault Tolerance
• Board and System Test
• (Embedded) System Test
• High-Level DfT and TPG
• System-in-Package (SiP) Test
• System-on-Chip (SoC) Test
Publications –ETS’08 will produce a Formal
Proceedings, published by the IEEE Computer Society, and a Web-based
Electronic Informal Digest of the selected papers. The best
contributions will be selected for submission to regular issues of the
“Journal of Electronic Testing: Theory and
Applications” (JETTA), published by Springer.
ETS’08 will present a Best Paper Award at
ETS’09.
Submissions
– ETS’08 seeks original, unpublished
contributions of the following types:
• scientific
papers presenting novel and complete research work
• workshop-type papers, including ‘emerging
ideas’ and ‘case studies’
• ‘Vendor Session’ presentations focusing
on new features of test-related products
• proposals for panels, embedded tutorials, and other
special sessions.
Detailed submission
instructions, including selection criteria and publication
policies, for the various types of contributions are posted on the ETS
web page.
TTTC
Test Technology Educational Program (TTEP) tutorials on emerging test
technology topics
will be offered during ETS’08.
Tutorial proposals should be submitted according to TTEP 2008
submission deadlines (http://computer.org/tab/tttc/teg/ttep).
As a new initiative for
ETS’08, the organizing committee would like to encourage
the organization of fringe workshops and will provide
extensive support for the organization of such events. Full
details can be found on the ETS web page.
Key
Dates:
Submission
deadline
:
December
7, 2007
extended to
December 14,
2007 (paper rgistration before December 7)
Notification
of acceptance
:
February
8, 2008
Camera-ready
manuscript
:
March
7, 2008
Further
Information:
Matteo
Sonza Reorda –
General Chair
Politecnico di Torino
Corso Duca degli Abruzzi, 24
10129 Torino, Italy
Tel.: +39-011-564-7055
Fax: +39-011-564-7099
Email: matteo.sonzareorda@polito.it
Patrick
Girard –
Program Chair
LIRMM
161, Rue Ada
34392 Montepellier, France
Tel.: +33-467-418-629
Fax: +33-467-418-500
E-mail: girard@lirmm.fr
