Call
for Papers
Extended Deadline
The IEEE European
Test Workshop is a well-recognized forum for presenting and discussing hot
topics, trends, emerging results, and practical applications in the area of
electronic-based circuit and system testing. The eighth edition of the workshop
will take place in 2003 in Maastricht, The Netherlands, a town with historic
roots that date back till the Roman empire, but where also the treaty on the
introduction of the Euro currency was signed by the European leaders.
ETW’03 is sponsored by the IEEE
Computer Society - Test Technology Technical Council (TTTC) and organized by
Philips Research Laboratories.
We cordially invite you to
participate and submit your contribution to ETW’03, which includes (but is not
limited to) the following topics:
- Analog, Mixed-Signal, and RF Test
- ATE Hardware and Software
- ATPG and High-Level TPG
- Debug and Diagnosis
- Defect/Fault Tolerance and Reliability
- Design Verification/Validation
- Emerging Testability Standards
- Failure Analysis, Defect and Fault
Modeling
- Fault Simulation
- FPGA Test
- High-Level DfT
- IDDX Test
- Low-Cost Testers
- Memory and Processor Test
- MEMS Testing
- On-Line and Off-Line BIST
- Scan-Based Techniques and Boundary
Scan
- Self-Repair Methodologies
- Signal Integrity Test
- System Test
- Test of Embedded Cores and
System-on-Chip
- Test of MCMs and Boards
- Test Resource Partitioning and
Embedded Test
- Test Synthesis and Synthesis for
Testability
- Thermal Testing
- Yield Analysis and Yield Enhancement
Submissions: For
the Research Track, the Program Committee invites original submissions
focusing on novel concepts and methodologies; full paper submissions are
preferred. For the Application Track, extended abstract or full paper
submissions are invited focusing on case studies and reports on industrial and/or
academic experiences, practices, and developments. All submissions should be at
least one page A4; accepted final manuscripts should not exceed six pages A4.
Electronic submission in PDF via
the workshop web page, which also informs about the review criteria for
both tracks, is strongly encouraged. Please identify a contact author with
complete information (mailing address, phone number, fax number, and e-mail
address).
Proceedings:
On site, ETW’03 will deliver handouts of the accepted contributions whose
authors wish to provide the corresponding materials. After the workshop, formal
proceedings of selected papers will be published by the IEEE Computer
Society. The Program Committee will select the contributions to be included in
the formal proceedings based on the review results and the quality of the papers
included in the handouts. The best contributions will appear in a special
issue of the Journal of Electronic Testing: Theory and Applications (JETTA),
published by Kluwer Academic Publishers.
Key Dates:
- Extended submission deadline: February
9, 2003
- Notification of acceptance: March
15, 2003
IEEE TTTC Test Technology Educational Program (TTEP)
2003
TTEP 2003 tutorials will be offered during May 25 on emerging test technology
topics. Tutorial proposals should be submitted according to the guidelines at http://tab.computer.org/tttc/teg/ttep
by November 20, 2002.
Further Information:
Erik Jan
Marinissen – General Chair
Philips Research Laboratories
Prof. Holstlaan 4 (WAY-41)
5656 AA Eindhoven, The Netherlands
Tel.: +31 40 274-3227
Fax: +31 40 274-4113
E-mail: Erik . Jan . Marinissen @ philips . com |
Sybille
Hellebrand – Program Chair
University of Innsbruck
Institute of Computer Science
Technikerstrasse 25, 6020 Innsbruck, Austria
Tel.: +43 512 507-6100
Fax: +43 512 507-2977
E-mail: Sybille . Hellebrand @ uibk . ac . at
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