Call
for Participation
The IEEE European
Test Workshop is a well-recognized forum for presenting and discussing hot
topics, trends, emerging results, and practical applications in the area of
electronic-based circuit and system testing. The eighth edition of the workshop
will take place in 2003 in Maastricht, The Netherlands, a town with historic
roots that date back till the Roman Empire, but where also the treaty on the
introduction of the Euro currency was signed by the European leaders.
We cordially invite you to
participate in ETW’03. ETW’03 is sponsored by the IEEE
Computer Society - Test Technology Technical Council (TTTC) and organized by
Philips Research Laboratories.
Program:
The high-quality ETW'03 technical program during May 26-28 offers a keynote
speech, paper presentations in two parallel tracks, embedded tutorials, poster
presentations, and breakout discussions. The paper presentations are organized
in a Research Track and an Applications Track. The Research Track addresses
novel concepts and methodologies, while the Applications Track reports on
industrial and/or academic experiences, developments, and case studies. The
ETW'03 program includes (but is not
limited to) the following topics:
- Analog, Mixed-Signal, and RF Test
- ATE Hardware and Software
- ATPG and High-Level TPG
- Debug and Diagnosis
- Defect/Fault Tolerance and Reliability
- Design Verification/Validation
- Emerging Testability Standards
- Failure Analysis, Defect and Fault
Modeling
- Fault Simulation
- FPGA Test
- High-Level DfT
- IDDX Test
- Low-Cost Testers
- Memory and Processor Test
- MEMS Testing
- On-Line and Off-Line BIST
- Scan-Based Techniques and Boundary
Scan
- Self-Repair Methodologies
- Signal Integrity Test
- System Test
- Test of Embedded Cores and
System-on-Chip
- Test of MCMs and Boards
- Test Resource Partitioning and
Embedded Test
- Test Synthesis and Synthesis for
Testability
- Thermal Testing
- Yield Analysis and Yield Enhancement
Tutorials: ETW'03
offers two full-day TTEP 2003 tutorials on May 25.
- The tutorial on Testing
(Embedded) Memories: New Fault Models, Tests, DfT, BIST, BISR, and
Industrial Results, by Ad J. van de Goor (Delft University of
Technology), discusses the more advanced topics in SRAM and DRAM testing.
The tutorial addresses fault models, traditional memory tests as well as new
march tests, testing two-port memories, optimal test strategies, DfT, BIST,
and BISR techniques.
- The tutorial on Defect-Oriented
Testing, by Peter Maxwell (Agilent Technologies) and Rob Aitken (Artisan
Components), discusses effective defect-oriented test methods for CMOS ICs.
The tutorial addresses defects and failure mechanisms, fault models, model
validation, test generation, application of defect-oriented testing for
improving product quality and lowering cost, and future trends in CMOS
technologies and nanotechnologies.
Social Event: ETW'03
offers a Social Event in the beautiful surroundings of Maastricht. The friendly,
inspiring atmosphere of ETW'03 allows plenty of opportunities to meet and
interact with your colleagues in an informal setting.
Registration: Discounts
are offered with early registration until April 23. For registration and hotel reservation, please visit the
ETW'03 registration web page.
Further Information:
Erik Jan
Marinissen – General Chair
Philips Research Laboratories
Prof. Holstlaan 4 (WAY-41)
5656 AA Eindhoven, The Netherlands
Tel.: +31 40 274-3227
Fax: +31 40 274-4113
E-mail: Erik . Jan . Marinissen @ philips . com |
Sybille
Hellebrand – Program Chair
University of Innsbruck
Institute of Computer Science
Technikerstrasse 25, 6020 Innsbruck, Austria
Tel.: +43 512 507-6100
Fax: +43 512 507-2977
E-mail: Sybille . Hellebrand @ uibk . ac . at
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