|
| Session 3A: Idd* Testing | paper | |
|---|---|---|
3A.1 |
Comparison of Defect
Detection Capabilities of Current-Based and Voltage-Based Test
Methods
B. Kruseman Philips Research Laboratories, The Netherlands |
|
3A.2 |
LEAP : An Accurate Defect-Free
IDDQ Estimator
A. Ferré - J. Figueras Universitat Politècnica de Catalunya, Spain |
|
3A.3 |
Defect Detection From Visual
Abnormalities In Manufacturing Process Using IDDQ
M. Sanada NEC, Japan |
|
|
