|
| Poster Session P1: Structural Testing | paper | |
|---|---|---|
| P1.1 | A Built-in Test
Solution for a SMART Silicon Micromachined Resonant Pressure
Sensor
C. Jeffrey - R. Rosing - A. Richardson Landcaster University, United Kingdom |
|
| P1.2 | Delay Fault Models Based on
Robust Propagation of Signal-Transitions
I. Pomeranz - S.M. Reddy University of Iowa, USA |
|
| P1.3 | A Fast Iddx Monitoring Scheme
for Testing Battery-Operated VLSI Circuits
I. Pecuh* - M. Margala* - V. Stopjakovà** * University of Alberta, Canada ** Slovak University of Technology, Slovakia |
|
| P1.4 | A Tool for Fault Extraction
in PCBs
L.C. Laranjeira - J. Machado da Silva - J. Silva Matos Universidade do Porto/INESC, Portugal |
|
| P1.5 | Mixed-signal core-based
testing
L. Fang - M. Stancic - H.G. Kerkhoff Universiy of Twente, The Netherlands |
|
|
