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Latest News
Symposium booklet is now avalaible
Invited Distinguished Speaker from Group of Dr. Albert FERT, Nobel Prize Laureate in Physics, 2007. See the DETMET program here
ETS on-line registration is now closed. Only on-site registration will be possible, starting from Monday, May 27th, at 13h00.
Presentation slides in ppt format must be uploaded though the MOLE System web site before May 20, 2013
Call for Papers
Click here to download the Call for Papers (PDF format)
Topic
You are invited to participate and submit contributions to ETS'13.
The areas of interest include (but are not limited to) the following topics.
- Analog Test
- ATE Hardware and Software
- Automatic Test Generation
- Board Test and Diagnosis
- Boundary Scan Test
- Built-In Self Test (BIST)
- Current-Based Test
- Defect-Based Test
- Delay and Performance Test
- Dependability and functional safety
- Design for Test(ability) – DfT
- Design Verification and Validation
- Diagnosis and Debug
- Economics of Test
- Failure Analysis
- Fault Modeling and Simulation
- Fault Tolerance
- High-Speed I/0 Test
- Low-Power IC Test
- Memory Test and Repair
- MEMS Test
- Microprocessor Test
- Mixed-Signal Test
- Nanotechnology Test
- On-line Test
- Power Issues in Test
- Reliability
- RF Test
- Self-Repair
- Signal Integrity Test
- Stacked or 3D ICs Test
- Standards in Test
- System Test
- SiP and SoC Test
- Test(ability) Synthesis
- Test of Reconfigurable Systems
- Test of Secured ICs
- Test Quality
- Thermal Issues in Test
- Transient and Soft Errors
- Yield Analysis and Enhancement
Publications
ETS’13 will produce Formal Proceedings of selected papers and an Informal Digest of Papers. The best contributions will be selected for submission to regular issues of the “Journal of Electronic Testing: Theory and Applications (JETTA),” published by Springer and “IEEE Design & Test of Computers.” A Best Paper Award of ETS’13 will be presented at ETS’14.
Submissions
ETS’13 seeks original, unpublished contributions of the following types:
- Scientific papers for the Formal Proceedings, presenting novel and complete research work.
- Workshop-type papers for the Informal Digest, including emerging ideas and case studies.
- Proposals for panels, embedded tutorials, and other special sessions.
- Vendor presentations focusing on new features of test related products.
- PhD student work-in-progress presenting their on-going work.
Detailed submission instructions, including selection criteria and publication policies, for the various types of contributions are posted on the ETS’13 web page.
The ETS’13 organizing committee also encourages the organization of fringe meetings and workshops.
Key Dates (Extended)
- Title and Abstract Submission deadline: December 3, 2012
- Final PDF Submission deadline: December 10, 2012
- Notification of acceptance: February 20, 2013
- Camera-ready manuscript: April 1, 2013
