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Symposium booklet is now avalaible
Invited Distinguished Speaker from Group of Dr. Albert FERT, Nobel Prize Laureate in Physics, 2007. See the DETMET program here
ETS on-line registration is now closed. Only on-site registration will be possible, starting from Monday, May 27th, at 13h00.
Presentation slides in ppt format must be uploaded though the MOLE System web site before May 20, 2013
Workshop on Design and Test Methodologies for Emerging Technologies (DETMET)
The goal of the Workshop on Design and Test Methodologies for Emerging Technologies is to provide an in-depth look at the novel design paradigms enabled by new technologies and the test techniques for ensuring their reliability and yield enhancement. The objectives of the workshop are two fold, scientific and educational. Workshop’s scientific objective is to bring together experts to present and discuss design and test solutions and experiences for upcoming and future technologies such as 3D integration, nanoscale and molecular scale circuits and systems, graphene and carbon nanotube based logic, nanomagnetic logic and memory. Second, the workshop seeks to be educational as it provides an opportunity for students to learn from scientists and faculty of different disciplines.
Click here to download the call for paper.
Technical Program
Day 1: Thursday May 30, 2013
16:00 – 16:05 Welcome Note from Organizers Dr. Aida Todri-Sanial and Prof. Sanjukta Bhanja
16:05 – 16:50 Keynote: On trends, challenges and technologies in future microprocessor and systems integration
Brian Burg, Thomas Brunschwiler, IBM Research Zurich, Switzerland
16 50 – 17:20 Controllability of Analysis of Local Switching Activity for Layout Design
Kohei Miyase*, Matthias Sauer**, Bernd Becker**, Xiaoqing Wen*, Seiji Kajihara*, *Kyushu Institute of Technology Japan, **University of Freiburg, Germany
17:20 – 17:30 Coffee Break
17:30 – 18:30 Testing Nanoarrays Fault Tolerance
Stefano Frache, Fabrizio Riente, Giovanna Turvani, Mariagrazia Graziano and Maurizio Zamboni, Politecnico di Torino, Italy, Politecnico di Torino, Italy
18:30 – 19:00 On line Testing of Logic and Memories in Emerging Technologies
Ioannis Voyiatzis, C. Esftathiou, C. Sgouropoulou, Greece
Day 2: Friday May 31, 2013
09:00 – 10:00 Keynote: Graphene for Spintronics***
Bruno Dlubak, M.-B. Martin, R. Weatherup, M. Sprinkle, B. Servet, S. Xavier, C. Berger, W. de Heer, S. Hoffman, J. Robertson, C. Deranlot, R. Mattana, F. Petroff, A. Anane, P. Seneor, A. Fert Unité Mixte de Physique CNRS/Thales, Palaiseau, France, and Universitéé Paris-Sud, Orsay, France
10:00 – 10:30 Coffee Break
10:30 – 11:00 Electromagnetic Simulation and Extraction of TSV Based 3D Devices over a Broad Frequency Regime
Roberto Suaya, Vassilis Kourkoulos, Mentor Graphics, France
11:00 – 11:30 Fault Tolerance Analysis of a Bis-Ferrocene QCA Wire
Azzurra Pulimeno, Mariagrazia Graziano, Ruiyu Wang and Gianluca Piccinini, Politecnico di Torino, Italy
11:30 – 12:00 Clock Uncertainity Modeling under Process and Voltage Variations for 3D-ICs
Hu Xu*, Vasilis Pavlidis**, *Synopsys Ireland, **University of Manchester, UK
12:00 – 12: 30 Effect of the Active Layer on Carbon Nanotube-based Cell Design
Mathias Beste, Mehdi B. Tahoori, Karlsruhe Institute of Technology, Germany
12:30 – 14:00 LUNCH
14:00 - 14:30 Efficient System-Level Simulation of Multiphysical Systems
Tamara Bechtold, IMTEK, University of Freiburg, Germany
14:30 - 15:00 Opportunities and Challenges for Energy Autonomous Wireless Systems with Micromachined Energy Harvesters
Dennis Hohlfeld, Reutlingen University, Germany
End of Workshop
