General Info


Test Spring School

Vendor Sessions

Local Information


Call for Papers
Click here to download the Call for Papers (PDF format)

You are invited to participate and submit contributions to ETS'12.
The areas of interest include (but are not limited to) the following topics.

  • Analog Test
  • Microprocessor Test
  • ATE Hardware and Software
  • Mixed-Signal Test
  • Automatic Test Generation
  • Nanotechnology Test
  • Board Test and Diagnosis
  • On-line Test
  • Boundary Scan Test
  • Power Issues in Test
  • Built-In Self Test (BIST)
  • Reliability
  • Current-Based Test
  • RF Test
  • Defect-Based Test
  • Self-Repair
  • Delay and Performance Test
  • Signal Integrity Test
  • Dependability
  • Stacked IC Test
  • Design for Test(ability) - DfT
  • Standards in Test
  • Design Verification and Validation
  • System Test
  • Diagnosis and Debug
  • System-in-Package (SiP) Test
  • Economics of Test
  • System-on-Chip (SoC) Test
  • Failure Analysis
  • Soft Errors
  • Fault Modeling and Simulation
  • Test(ability) Synthesis
  • Fault Tolerance
  • Test of Reconfigurable Systems
  • High-Speed I/0 Test
  • Test Quality
  • Memory Test and Repair
  • Thermal Issues in Test
  • MEMS Test
  • Yield Analysis and Enhancement

  • Publications
    ETS'12 will produce Formal Proceedings of selected papers and an Informal Digest of Papers.
    The best contributions will be selected for submission to regular issues of the "Journal of Electronic Testing: Theory and Applications" (JETTA), published by Springer and IEEE Design & Test of Computers.
    A Best Paper Award of ETS'12 will be presented at ETS'13.

    ETS'12 seeks original, unpublished contributions of the following types:
    • Scientific papers for the Formal Proceedings, presenting novel and complete research work.
    • Workshop-type papers for the Informal Digest, including "emerging ideas" and "case studies".
    • Proposals for panels, embedded tutorials, and other special sessions.
    • Vendor presentations focusing on new features of test related products.
    • Student work-in-progress presenting on-going and not yet complete work.
    • Doctoral student contest is open for doctoral students in their final year.
    Submission instructions are given here.

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