IEEE European Test Symposium 2012

Analog Test		Microprocessor Test
ATE Hardware and Software		Mixed-Signal Test
Automatic Test Generation		Nanotechnology Test
Board Test and Diagnosis		On-line Test
Boundary Scan Test		Power Issues in Test
Built-In Self Test (BIST)		Reliability
Current-Based Test		RF Test
Defect-Based Test		Self-Repair
Delay and Performance Test		Signal Integrity Test
Dependability		Stacked IC Test
Design for Test(ability) - DfT		Standards in Test
Design Verification and Validation		System Test
Diagnosis and Debug		System-in-Package (SiP) Test
Economics of Test		System-on-Chip (SoC) Test
Failure Analysis		Soft Errors
Fault Modeling and Simulation		Test(ability) Synthesis
Fault Tolerance		Test of Reconfigurable Systems
High-Speed I/0 Test		Test Quality
Memory Test and Repair		Thermal Issues in Test
MEMS Test		Yield Analysis and Enhancement

Publications

ETS'12 will produce Formal Proceedings of selected papers and an Informal Digest of Papers.
The best contributions will be selected for submission to regular issues of the "Journal of Electronic Testing: Theory and Applications" (JETTA), published by Springer and IEEE Design & Test of Computers.
A Best Paper Award of ETS'12 will be presented at ETS'13.

Submissions

ETS'12 seeks original, unpublished contributions of the following types:

Scientific papers for the Formal Proceedings, presenting novel and complete research work.
Workshop-type papers for the Informal Digest, including "emerging ideas" and "case studies".
Proposals for panels, embedded tutorials, and other special sessions.
Vendor presentations focusing on new features of test related products.
Student work-in-progress presenting on-going and not yet complete work.
Doctoral student contest is open for doctoral students in their final year.

Submission instructions are given here.

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