Call for papers
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print quality (468 kB).
30.11.2010 - Details for all submitted papers are
required on December 6th. The uploading of the final PDF must be
completed no later than December 13th.
The IEEE European Test Symposium (ETS) is
Europe's premier forum dedicated to presenting and discussing scientific
results, emerging ideas, practical applications, hot topics, and new trends in
the area of electronic-based circuit and system testing. A Test Spring School
will be organized in conjunction with ETS'11.
In 2011 ETS will take place in Trondheim, Norway
and is being organized by the Norwegian University of Science and Technology
(NTNU) and sponsored by the Test Technology Technical Council (TTTC) of the
IEEE Computer Society. Norway is known for its white summer nights; during the
week of ETS'11 the sun will rise in Trondheim well before 4am and set close to
11pm.
You are invited to participate and submit your
contributions to ETS'11. The areas of interest include (but are not limited to)
the following topics:
- Analog Test
- ATE Hardware and Software
- Automatic Test Generation
- Board Test and Diagnosis
- Boundary Scan Test
- Built-In Self Test (BIST)
- Current-Based Test
- Defect-Based Test
- Delay and Performance Test
- Dependability
- Design for Test(ability) (DfT)
- Design Verification and Validation
- Diagnosis and Debug
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- Economics of Test
- Failure Analysis
- Fault Modelling and Simulation
- Fault Tolerance
- High-Speed I/O Test
- Memory Test and Repair
- MEMS Test
- Microprocessor Test
- Mixed-Signal Test
- Nanotechnology Test
- On-Line Test
- Power Issues in Test
- Reliability
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- RF Test
- Self-Repair
- Signal Integrity Test
- Stacked IC Test
- Standards in Test
- System Test
- System-in-Package (SiP) Test
- System-on-Chip (SoC) Test
- Test(ability) Synthesis
- Test of Reconfigurable Systems
- Test Quality
- Thermal Issues in Test
- Yield Analysis and Enhancement
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Publications - ETS'11 will produce Formal
Proceedings of selected papers and an Informal Digest of Papers. The best
contributions will be selected for submission to regular issues of the "Journal
of Electronic Testing: Theory and Applications" (JETTA), published by Springer.
A Best Paper Award of ETS'11 will be presented at ETS'12.
Submissions - ETS'11 seeks original,
unpublished contributions of the following types:
- Scientific papers for the Formal
proceedings, presenting novel and complete research work.
- Workshop-type papers for the Informal
Digest, including 'emerging ideas' and 'case studies'.
- Proposals for panels, embedded
tutorials, and other special sessions.
- Vendor presentations focusing on new
features of test related products.
- Student work-in-progress presenting
on-going and not yet complete work.
- Doctoral student contest is open for
doctoral students in their final year.
Detailed submission instructions, including
selection criteria and publication policies, for the various types of
contributions are posted on the ETS'11 web page.
The ETS'11 organizing committee also encourages
the organization of fringe meetings and workshops. Details can be found on the
ETS'11 web page.
Key Dates:
Paper
submission deadline: December 6, 2010
Notification of acceptance: February
15, 2011
Camera-ready manuscript: March 15, 2011 |
Other Submission
Dates:
Doctoral student contest: January 15, 2011
Vendor &
special sessions: January 28, 2011
Student work-in-progress: April 15, 2011
|
Further Information:
Einar J. Aas - General Chair
Department of Electronics and
Telecommunications
Norwegian University of Science and Technology
NO-7491 Trondheim, Norway
Tel: +47 73 59 43 17,
Fax: +47 73 59 14
41
E-Mail: einar.j.aas@iet.ntnu.no |
Erik Larsson -
Program Chair
Department of Computer Science
Linköping
University
SE-581 83 Linköping, Sweden
Tel: +46 70 965 66 19,
Fax: +46 13 28 44 99
E-Mail: erik.larsson@liu.se |
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