Technical program
The technical programme is ready. You may
download the programme booklet (4,5 MB).
Program at a glance
Download pdf.
Monday 23rd May
14:00 -
18:00 |
AUDITORIUM R1
(TSS@ETS) Track A
Room
R1
Embedded Memory Testing: Fault Models, Test Algorithms, MBIST and
Industrial Results |
AUDITORIUM R9
Room R9
(TSS@ETS) Track B
Design for Test and Fault Tolerance for Nanoscale Circuits |
The Monday embedded
tutorials are part of the Test Spring School@ETS 2011 and they are open to
all regular ETS attendees! The registration desk will be open one hour befor
the tutorial starts.
The sessions at ETS 2011
The sessions at ETS 2011 are named after some of
our famous Norwegians. You may read more at Wikipedia about the mathematician
Niels Henrik Abel, the composer and pianist
Edvard
Grieg, the playwright and poet
Henrik
Ibsen and the scientist, explorer, diplomat, humanitarian and Nobel
laureate
Fridtjof Nansen.
Tuesday 24th May
| |
Abel |
Ibsen |
Nansen |
Grieg |
Lobby/ canteen |
| 09:00 |
Opening session |
|
|
|
|
| 11:00 |
|
|
|
|
Posters and coffee |
| 12:00 |
Converter testing |
Security |
Industrial testing (Vendor session) |
Power switches |
|
| 13:00 |
|
|
|
|
Lunch in canteen |
| 14:30 |
Emerging technologies |
3D technology |
Mixed signal and RF test |
|
|
| 16:00 |
|
|
|
|
Posters and coffee |
| 17:00 |
Dependability |
Test data compression, compaction and diagnosis |
Test Equipment 1 (Vendor session) |
|
|
| 18:30 |
|
|
PhD forum |
|
|
Wednesday 25th May
| |
Abel |
Ibsen |
Nansen |
Lobby/ canteen |
| 09:00 |
Advances in test |
Contactless and memory testing |
Test-EDA (Vendor session) |
|
| 10:30 |
|
|
|
Posters and coffee |
| 11:30 |
ATPG 1 |
Analog production test |
Test Equipment 2 (Vendor session) |
|
| 13:00 |
|
|
|
Lunch in canteen |
| 14:30 |
Embedded tutorial A:
Formal Verification of SoC
– Industrial Experiences and Scientific Perspective |
|
Embedded tutorial B:
Towards Variation-Aware
Test |
|
| 15:45 |
|
|
|
Social event – bus departure |
Thursday 26th May
| |
Abel |
Ibsen |
Nansen |
Lobby/ canteen |
| 09:00 |
ATPG 2 |
Post silicon debug |
Industrial testing (Vendor session) |
|
| 10:30 |
|
|
|
Poster Session 4 and coffee
TTTC’s E. J. McCluskey
Best Doctoral Thesis Award and Student Work-in-Progress |
| 11:30 |
Panel A
Working Silicon versus Working
Board/System: Closing the Gap |
Panel B
Taking the Sense and Nonsense Out of
Temperature-Aware Testing |
Panel C
BIST for non-digital IPs: can we (do we
need to) estimate test costs before production? |
|
| 13:00 |
|
|
|
Lunch in canteen |
| 14:30 |
Diagnosis |
|
|
|
| 16:00 |
Closing |
|
|
|
Thursday 26th - Friday
27th
Fringe workshops
| Dependability Issues in Deep-submicron Technologies
(DDT) |
IEEE International Workshop on Processor Verification, Test and
Debug (IWPVTD’11) |
4th IEEE International Workshop on Impact of Low-Power
design on Test and Reliability (LPonTR’11)
|
|
