Vendor sessions
ETS'11 is offering commercial vendors the
opportunity to give technical presentations Vendor Sessions in a track parallel
to the technical paper sessions. These presentations will be listed in the
symposium program along with the technical sessions, and should be targeted to
the ETS technical audience. The Vendor Sessions differ from other ETS
presentations in that company names, logos, and product names may be mentioned
explicitly. Typical content includes product descriptions, case studies, best
practices, and user testimonials.
Presentation opportunities of 30-minute duration
are available on a first-come first-served basis, but priority will be given to
those companies that are also corporate supporters of
ETS'11. Attendance at the sessions is open to all symposium attendees, and
vendor representatives will be able to hand out literature at the session.
Proposals for the Vendor Sessions should be technical or application focused,
rather than overtly sales-and-marketing focused. Proposal selection is based on
the technical content and relevance to ETS'11 audience and topics. The areas of
interest of ETS'11 include (but are not limited to) the following topics:
- Analog Test
- ATE Hardware and Software
- Automatic Test Generation
- Board Test and Diagnosis
- Boundary Scan Test
- Built-In Self Test (BIST)
- Current-Based Test
- Defect-Based Test
- Delay and Performance Test
- Dependability
- Design for Test(ability) (DfT)
- Design Verification and Validation
- Diagnosis and Debug
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- Economics of Test
- Failure Analysis
- Fault Modelling and Simulation
- Fault Tolerance
- High-Speed I/O Test
- Memory Test and Repair
- MEMS Test
- Microprocessor Test
- Mixed-Signal Test
- Nanotechnology Test
- On-Line Test
- Power Issues in Test
- Reliability
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- RF Test
- Self-Repair
- Signal Integrity Test
- Stacked IC Test
- Standards in Test
- System Test
- System-in-Package (SiP) Test
- System-on-Chip (SoC) Test
- Test(ability) Synthesis
- Test of Reconfigurable Systems
- Test Quality
- Thermal Issues in Test
- Yield Analysis and Enhancement
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